Hot-Carrier Reliability of MOS VLSI Circuits.pdf

Hot-Carrier Reliability of MOS VLSI Circuits

Yusuf Leblebici

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits. Hot-carrier induced degrada­ tion of MOS transistor characteristics is one of the primary mechanisms affecting the long-term reliability of MOS VLSI circuits. It is likely to become even more important in future generation chips, since the down­ ward scaling of transistor dimensions without proportional scaling of the operating voltage aggravates this problem. A thorough understanding of the physical mechanisms leading to hot-carrier related degradation of MOS transistors is a prerequisite for accurate circuit reliability evaluation. It is also being recognized that important reliability concerns other than the post-manufacture reliability qualification need to be addressed rigorously early in the design phase. The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits. If the predicted reliability does not satisfy the requirements, appropriate design modifications may be carried out to improve the resistance of the devices to degradation.

Amazon.fr - Hot-Carrier Reliability of MOS VLSI …

7.27 MB DATEIGRÖSSE
1461364299 ISBN
Englisch SPRACHE
Hot-Carrier Reliability of MOS VLSI Circuits.pdf

Technik

PC und Mac

Lesen Sie das eBook direkt nach dem Herunterladen über "Jetzt lesen" im Browser, oder mit der kostenlosen Lesesoftware Adobe Digital Editions.

iOS & Android

Für Tablets und Smartphones: Unsere Gratis tolino Lese-App

Andere eBook Reader

Laden Sie das eBook direkt auf dem Reader im Hugendubel.de-Shop herunter oder übertragen Sie es mit der kostenlosen Software Sony READER FOR PC/Mac oder Adobe Digital Editions.

Reader

Öffnen Sie das eBook nach der automatischen Synchronisation auf dem Reader oder übertragen Sie es manuell auf Ihr tolino Gerät mit der kostenlosen Software Adobe Digital Editions.

Aktuelle Bewertungen

avatar
Sofia Voigt

Hot-Carrier Reliability of MOS VLSI Circuits …

avatar
Matteo Müller

Hot-Carrier Reliability of MOS VLSI Circuits (The Springer International Series in Engineering and Computer Science (227), Band 227) | Leblebici, Yusuf, Sung-Mo (Steve) Kang | ISBN: 9780792393528 | Kostenloser Versand für alle Bücher mit Versand und Verkauf duch Amazon.

avatar
Noel Schulze

The rapid advances in semiconductor manufacturing technology have created tough reliability problems. Failure mechanisms such as hot-carrier effect, dielectric breakdown, electrostatic discharge and electromigration have posed tremendous threats to the longterm reliability of VLSI circuits.

avatar
Jason Lehmann

Design Considerations for CMOS Digital Circuits with ...

avatar
Jessica Kohmann

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits.